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晶界界面匹配定量表征方法

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  • Affilication of Author(s):材料科学与工程学院

  • Patent Coverage:国内

  • School Sign:单独

  • First Author:王卫国

  • Type of Patent:Invent

  • State of Patent:专利授权

  • Application Number:202011173146.8

  • Authorization number:CN 112326656 B

  • Service Invention or Not:no

  • Application Date:2020-10-28

  • Authorization Date:2023-06-02

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