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李锦彬

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Associate professor  

Patents

一种高频磁元件绕组损耗的测量方法

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Affilication of Author(s):电子电气与物理学院

Patent Coverage:国内

Disigner of the Invention:黄文彬,黄晓生,郑荣进,叶建盈

Type of Patent:发明专利

State of Patent:专利授权

Application Number:201811432097.8

Authorization number:4283137

Number of Inventors:5

Service Invention or Not:no

Application Date:2018-11-28

Publication Date:2021-03-02

Authorization Date:2021-03-02