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Y. Jia, L. Guo, Z. Li, J. Huang, W. Lu, H. Chen, X. Chen, An Effective Approach for the Identification of Carrier Type and Local Inversion Doping in Graphene by Biased Atomic Force Microscopy, Adv. Electron. Mater. 2 (2016). https://doi.org/10.1002/aelm.201500255.
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